FIS4-NIR Near-Infrared Wavefront Sensor

In the field of near-infrared optics, wavefront detection has always faced industry challenges such as poor equipment adaptability and high technical barriers. The FIS4-NIR near-infrared wavefront sensor, developed by a research and development team led by Professor Yang Yongying from Zhejiang University, is specifically designed for near-infrared application scenarios, making the 'invisible' wavefront clear and measurable.

This sensor is suitable for aberration measurement of optical systems, calibration of optical systems, measurement of internal lattice distribution of materials, metasurface, and metrolens wavefront measurement. Based on the four-wavefront lateral shearing interferometry technology, it can obtain bidirectional wavefront information with a single acquisition without the need for a reference mirror. It is specially optimized for the near-infrared wavelength band and features nanometer-level accuracy, wide dynamic range, and real-time processing capability. At the same time, it inherits the common-path interferometry architecture, providing strong adaptability to environmental vibration and temperature and humidity fluctuations.

The fully self-developed supporting analysis software boasts an intuitive interface and convenient operation. It supports synchronous visualization of multi-dimensional data such as 3D topography, contour maps, and phase maps, enabling real-time dynamic acquisition of wavefront changes. With one click, it can output core parameters such as PV, RMS, PSF, and MTF. It supports customizable measurement areas in circular/square shapes and provides functions such as drawing height curves for measurement and area roughness analysis. The entire process, from data acquisition to analysis output, is efficient and smooth.

FIS4-NIR near-infrared wavefront sensor performs competitively with similar international products, while offering rapid response with localized technical support and flexible customization services, helping users overcome the technical constraints and service wait times associated with overseas brands. This represents a solid breakthrough for China's intelligent manufacturing in the field of near-infrared wavefront measurement.