The quality of nanomaterials is monitored in real time
With the deepening of research on nanomaterials, its unique physical and chemical properties bring new opportunities to the research of physics, chemistry, materials, biology, medicine and other disciplines. For example, in the field of medicine, nanoparticles are used in targeted drug delivery systems to improve drug efficacy and reduce side effects; In the energy sector, nanomaterials are used to develop faster and more efficient solar cells and energy storage systems. In order to fully utilize the potential of nanomaterials, accurate detection and analysis of them become essential. Accurate nanomaterials detection can not only help researchers understand the fundamental properties of materials, but also ensure the performance and safety of materials. At the same time, as nanomaterials become more widely used in commercial products, ensuring their quality and consistency is also necessary to meet regulatory requirements.
The FIS4 wavefront sensor's high resolution and sensitivity make it an ideal device for detecting objects at the nanoscale. Not only that, the sensor is able to make measurements without touching the material, which is particularly important for nanostructures that are vulnerable to contamination or damage.
By using FIS4 wavefront interference sensors, researchers and engineers can monitor the quality of nanomaterials in real time, ensuring that every step of the production process complies with standards. This not only helps to promote the advancement of scientific research, but also ensures the performance and safety of nanomaterials during commercialization, providing a solid foundation for a wide range of industry applications.
Measurement advantage
No reference surface required to avoid impact
High energy pulse beam quality detection
Common channel interference, strong anti-noise ability
On-site, real-time, online detection
Industry application field
▎Optical fiber spherical wave source with end taper
▎nano materials
▎high polymer material
Provides high resolution, non-contact measurement capabilities
The research and application of micro and nano light waves is the core of the development of micro and nano photonics. These micro and nano light waves have unique physical properties at the micro scale, such as highly compact size, excellent light field confinement, low loss, and integration with other microelectronic components, which makes them have a wide range of applications in many fields, such as optical communication, optical computing, and biosensing.
In the process of designing and optimizing micro-nano photonic devices, it is very important to accurately measure and analyze the optical properties of micro-nano waveguides. FIS4 wavefront interference sensor can measure and analyze the propagation characteristics of light waves in microwaveguides, including key parameters such as phase distribution, intensity and wavefront shape. From these measurements, the researchers can obtain detailed information about the waveguide's performance, such as mode distribution, loss, and dispersion.
The FIS4 wavefront interference sensor provides high-resolution, non-contact measurement capabilities to accurately evaluate the optical properties of micro-nano waveguides without affecting the waveguide structure. This capability helps fine-tune waveguide design, optimize manufacturing processes, and achieve high-performance micro and nano photonic devices.
Measurement advantage
No reference surface required to avoid impact
High energy pulse beam quality detection
Common channel interference, strong anti-noise ability
On-site, real-time, online detection
行业领域
▎Detection and analysis of reaction ion beam etching results
▎Waveguide light output diagram
▎Surface shape test results
Surface shape detection results of waveguide point diffraction interference detection system:
(a) two-dimensional and (b) three-dimensional surface shape distribution
Zygo interferometer surface shape detection results:
(c) Two-dimensional and (d) three-dimensional surface shape distributions.
It provides accurate wavefront measurements for the optical tweezers, helping researchers optimize the light field for more detailed manipulation
Since its invention, optical tweezers technology has become indispensable in the life sciences, using highly focused laser beams to achieve precise manipulation of tiny particles such as cells and viruses, and to move and hold samples without contact. The wavefront quality of the laser beam is critical to the efficiency and accuracy of the optical tweezers because it determines the distribution and focusing performance of the light field.
The FIS4 wavefront interference sensor provides accurate wavefront measurements for the optical tweezers, helping researchers optimize the light field for more detailed manipulation. The FIS4 wavefront interference sensor detects distortions caused by defects in optical components or changes in the refractive index of the medium, ensuring that the optical tweezers generate sufficient force to stably capture and manipulate microobjects. In addition, it can quantify forces, which is critical for understanding intracellular mechanical responses and intermolecular interactions, such as measuring particle displacement and force application in virus detection and drug screening.
Measurement advantage
No reference surface required to avoid impact
High energy pulse beam quality detection
Common channel interference, strong anti-noise ability
On-site, real-time, online detection
Industry application field
▎Optical tweezers system
▎Optical tweezers system
▎Optical tweezers system
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