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FIS4 wavefront sensor: More than just laser measurement, it's an "all-rounder" for end-to-end optical system inspection.

2025-09-15 19:06:05

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In optical research and manufacturing, precise testing is crucial for ensuring p

In optical research and manufacturing, precise testing is crucial for ensuring performance. Since Professor Yang Yongying's team at Zhejiang University introduced radial shear wavefront detection in 2006, after 17 years of dedicated research, they have launched the wide-spectrum FIS4 series of wavefront sensors. The FIS4 wavefront sensor can not only directly measure the wavefront information of lasers, but also perform 'physical examinations' on any optical component in the optical path through transmission and reflection modes, handling everything from lens surface shape to system assembly and adjustment—all in one device! Today, we'll reveal how the FIS4 wavefront sensor becomes an 'all-around testing expert' for high-precision optical design.

I. Laser Inspection: Comprehensive Control from Beam Waist to Aberrations

The FIS4 wavefront sensor directly measures the core parameters of the laser, ensuring high-quality laser output:

✅ Beam Waist Positioning: Accuracy ±0.5μm, solving the pain point of focus drift in laser processing.

✅ M² Factor Analysis: Real-time monitoring of beam quality to optimize laser design.

✅ Wavefront Distortion Diagnosis: Identifies higher-order aberrations such as thermal lensing and astigmatism (64 Zernike coefficients)

II. Transmission-based Inspection (Lens, Windows, etc.): 'Precision Inspection' of Optical Lenses

Surface Shape Accuracy: PV value detection lower limit λ/50, ensuring the processing quality of optical components.

Through Wavefront Analysis: Identifying material inhomogeneities or internal stress, avoiding image degradation.

Effective Focal Length Verification: Deviation from theoretical design value<0.1%, ensuring the assembly accuracy of the optical system.

III. Reflective Inspection: The 'Eagle Eye' for Coating and Assembly

The FIS4 wavefront sensor can also accurately evaluate the performance of components such as mirrors and prisms through reflected light paths:

✅ Surface Shape Error Detection: RMS repeatability ≤2nm, ensuring high reflectivity

✅ Assembly Stress Analysis: Inferring assembly pressure from astigmatism variations to avoid lens deformation

✅ Coating Uniformity Assessment: Locating coating defects by combining light intensity distribution

IV. System-Level Testing: 'End-to-End Monitoring' of the Optical Path

The FIS4 wavefront sensor can not only measure individual components but also provide comprehensive evaluation of the entire optical system:

✅ Lithography Objective Assembly and Adjustment: Real-time monitoring of the cumulative aberrations of multiple lenses to guide precise adjustments

✅ LiDAR System Optimization: Tracking wavefront changes throughout the entire process from laser to beam expander to scanning mirror

✅ Space Optical Payload Testing: Measurement repeatability better than 1/1000λ

The FIS4 wavefront sensor is not only a powerful tool for laser inspection, but also an 'all-around assistant' for optical system R&D and production. From incoming components to complete system testing, it uses data to ensure precise implementation of every design!

Jingnaike Optoelectronics, in partnership with Yucheng Optoelectronics, will continue to expand the wavelength coverage and technological boundaries of the FIS4 wavefront sensor, providing more flexible inspection solutions for customers in the semiconductor, aerospace, and biomedical industries. We sincerely invite global partners to inquire and jointly explore the infinite possibilities of precision manufacturing! For detailed information, please visit our website and contact customer service or a sales consultant. We hope to provide you with a better and faster user experience.


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FIS4 wavefront sensor: More than just laser measurement, it's an "all-rounder" for end-to-end optical system inspection.
In optical research and manufacturing, precise testing is crucial for ensuring p
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