FIS4-DPHASE-1
Four-Wave Dynamic Interferometer
Application: High-precision surface detection of spherical and flat optical components
◆ Utilizes a combined dual interference system: common-path interference is stable, no phase shifting is required, and adjustment is convenient, suitable for high-precision and stable measurement of large-aperture and long optical path
◆ Measurement resolution 2 nm
◆ Strong measurement repeatability ≤1/1000λ (633nm band)
◆ No vibration isolation is required, stability & vibration resistance is super strong (suitable for high-precision detection in factories)
◆ Equipped with a five-dimensional adjustment frame, adaptable to various posture adjustments, easy to operate
◆ Adapt to a spherical mirror with different F numbers: F1, F3, F5 … …
◆ Real-time display of output wavefront PV value, RMS value, Zernike coefficient … …
FIS4 four-wave dynamic interferometer is based on the principle of common path four-wave lateral shearing interference. Universal lens; strong vibration resistance, no need for a separate vibration isolation platform; no phase shifting, easy to adjust; high cost performance; 100% domestically developed, high precision! High vibration resistance! Real-time observation!
Easy to adjust
Like an industrial camera
Quick to use
Single optical path, good vibration resistance
No vibration isolation required
Measurement can be done on an ordinary wooden table
Measurement
Repeatability better than
1/1000λ
Compatible
Infrared, ultraviolet
Visible light band
With high-speed camera
can achieve
ultra-high frame rate sampling
One-to-one
guidance
light path construction
Laser beam wavefront detection optical path
Laser beam wavefront detection measurement example
Adaptive optics light path
Adaptive optics - wavefront detection response of Zernike modes
Optical plane surface measurement optical path
Optical plane surface measurement example
Optical spherical surface measurement optical path
Optical spherical surface measurement example
Optical window measurement light path
Optical Window Measurement Example
Wafer surface roughness detection optical path
Wafer surface roughness measurement example
|
Light Source Type |
Continuous laser, pulsed laser, LED, halogen lamp, and other broadband sources |
|
Wavelength range |
400nm~900nm |
|
Target size |
13.3mm×13.3mm |
|
Spatial resolution |
26μm |
|
Sampling resolution |
512×512 |
|
Absolute accuracy |
10nmRMS |
|
Phase resolution |
≤2nmRMS |
|
Dynamic range |
≥160μm |
|
Sampling rate |
30fps |
|
Real-time processing speed |
5Hz（Full resolution） |
|
Interface type |
GIGE |
|
dimension |
70mmx71mmx68.5mm |
|
weigh |
about 380g |
|
Cooling Method |
Semiconductor refrigeration |
◆ Friendly software interactive interface, displaying 3D morphology and contour map
◆ Output PV, RMS, POW, PSF, OTF, MTF and other numerical values
◆ Freely select the measurement area in circular or square shape, and freely adjust it after selection
◆ Real-time dynamic acquisition and display, convenient for dynamic observation of 3D waveform changes
◆ Can measure the height value curve by pulling the wire, calculate the numerical parameters such as regional roughness
INQUIRY
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CONTACT
7X24小时电话 周一至周六 9:00-18:00
0757-6668-88268
Hangzhou Zernike Optical Technology Co., LTD
Full range of authorized dealers
Jiangsu Yucheng light sense technology Co., LTD
Email：
电话：0757-666888268
传真：0757-666999368
公司地址：佛山市禅城区某某某路同某某莫大厦1208
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©2024 Copyright Jiangsu Yucheng Light Sense Technology Co., LTD
Record number: Su ICP for 2024068497
TEL：18012804887
EMAIL：Dana@zernikeoptics.cn
Address:：Nanjing University Science Park, 8 Yuanhua Road, Xianlin, Qixia District, Nanjing, Jiangsu Province
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