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Identify and correct aberrations in optical systems with high accuracy to improve the imaging quality of the system

The application of FIS4 four-wave shear interferometry technology in optical system calibration is mainly based on its ability to measure wavefront errors with high precision, which can identify and correct aberrations in optical systems with high precision and improve the imaging quality of the system. It provides accurate measurement methods for aberration identification, system performance evaluation, optical component adjustment, feedback control, thermal stability of optical systems, etc., which helps to improve the accuracy and reliability of optical systems, and will become an indispensable tool in modern optical engineering.

Measurement advantage

Complete measurement with a single frame

 

◆ Wave front distribution

◆ Aberration analysis

◆ Image quality evaluation

High resolution

 

◆ Up to 512×512 phase sampling points

◆ High dynamic range

◆ Nanoscale sensitivity

Easy to adjust integration

 

◆ Small and compact

◆ Support parallel and convergent beams

◆ Super vibration resistance

Measurement example

▎The optical system calibrates the optical path

      

▎Optical system calibration

Measurement demonstration

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CONTACT

 

7X24小时电话   周一至周六 9:00-18:00

0757-6668-88268

Hangzhou Zernike Optical Technology Co., LTD
Full range of authorized dealers   

Jiangsu Yucheng light sense technology Co., LTD

Email：

Dana@zernikeoptics.cn


电话：0757-666888268

传真：0757-666999368

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©2024 Copyright Jiangsu Yucheng Light Sense Technology Co., LTD  

Record number: Su ICP for 2024068497

TEL：18012804887         

EMAIL：Dana@zernikeoptics.cn

Address:：Nanjing University Science Park, 8 Yuanhua Road, Xianlin, Qixia District, Nanjing, Jiangsu Province


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