Improve the manufacturing quality and reliability of optical window pieces and reduce production costs

FIS4 four-wave transverse shear interferometry technology has shown significant advantages in the quality detection and analysis of optical window slices. The application areas of this technology include:

Surface flatness measurement: FIS4 technology can accurately determine the surface shape of the optical window, identify any small irregularities, and ensure that its flatness meets the requirements of high standards.

◆ Film uniformity detection: For optical Windows coated with various functional films, FIS4 can assess the thickness and uniformity of the film layer, which is essential to ensure optical performance.

◆ Stress and strain analysis: FIS4 technology can reveal the internal stresses that may be introduced during the manufacturing process, providing manufacturers with the basis to adjust the process to reduce or eliminate these stresses.

 Thermal expansion characteristics evaluation: Through the measurement of FIS4 technology, the dimensional stability of optical window material under temperature changes can be evaluated to ensure its reliability under different environmental conditions.

Using these inspection capabilities, FIS4 technology provides critical support in the manufacturing and quality control process of optical window pieces, enabling manufacturers to improve the quality and reliability of their products and helping to reduce production costs. These advantages make FIS4 a powerful tool for ensuring that optical window pieces meet increasingly demanding performance standards.

Measurement advantage

Complete measurement with a single frame

 

◆ Surface shape measurement

◆ Material internal evaluation

◆ Stress analysis

High resolution

 

◆ Up to 512×512 phase sampling points

◆ High dynamic range

◆ Nanoscale sensitivity

Easy to adjust integration

 

◆ Small and compact

◆ Support parallel and convergent beams

◆ Super vibration resistance

Measurement example

Optical window piece detects the optical path

      

Optical window piece detection

Measurement demonstration

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CONTACT

 

7X24小时电话   周一至周六 9:00-18:00

0757-6668-88268

Hangzhou Zernike Optical Technology Co., LTD
Full range of authorized dealers   

Jiangsu Yucheng light sense technology Co., LTD


电话:0757-666888268

传真:0757-666999368

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©2024 Copyright Jiangsu Yucheng Light Sense Technology Co., LTD  

Record number: Su ICP for 2024068497

TEL:18012804887         

EMAIL:Dana@zernikeoptics.cn

Address::Nanjing University Science Park, 8 Yuanhua Road, Xianlin, Qixia District, Nanjing, Jiangsu Province


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