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The density distribution inside the transparent optical element is sensitively detected

The FIS4 four-wave interference sensor is a highly sensitive measurement tool that is able to detect changes in the wave front passing through the optical element. In transparent optical elements, any internal lattice irregularity can lead to changes in the density distribution within the material. This density inhomogeneity can further cause local changes in the refractive index of the material, since the refractive index is directly related to the density of the material. As light waves pass through regions with different refractive indices, their optical path (how far the light actually travels through the material) changes. Due to the difference in light range, light waves in different regions will produce phase difference when exiting, and this phase difference can be observed and measured by interference pattern. By detecting these phase differences, the FIS4 sensor can very sensitively detect the density distribution inside transparent optical components, which can be used in internal stress analysis, material uniformity assessment and other applications.

Measurement advantage

Complete measurement with a single frame

 

◆ Surface shape measurement

◆ Material internal evaluation

◆ Internal stress analysis

High resolution

 

◆ Up to 512×512 phase sampling points

◆ High dynamic range

◆ Nanoscale sensitivity

Easy to adjust integration

 

◆ Small and compact

◆ Support parallel and convergent beams

◆ Super vibration resistance

Measurement example

▎Optical path for measuring the density distribution inside the material

      

▎Material internal lattice distribution test

Measurement demonstration

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